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| testable combinational logic circuit design: Digital Circuit Testing and Testability Parag K. Lala, 1997 An easy to use introduction to the practices and techniques in the field of digital circuit testing. Lala writes in a user-friendly and tutorial style, making the book easy to read, even for the newcomer to fault-tolerant system design. Each informative chapter is self-contained, with little or no previous knowledge of a topic assumed. Extensive references follow each chapter. |
| testable combinational logic circuit design: The Board Designer's Guide to Testable Logic Circuits Colin M. Maunder, 1992 |
| testable combinational logic circuit design: Digital System Test and Testable Design Zainalabedin Navabi, 2010-12-10 This book is about digital system testing and testable design. The concepts of testing and testability are treated together with digital design practices and methodologies. The book uses Verilog models and testbenches for implementing and explaining fault simulation and test generation algorithms. Extensive use of Verilog and Verilog PLI for test applications is what distinguishes this book from other test and testability books. Verilog eliminates ambiguities in test algorithms and BIST and DFT hardware architectures, and it clearly describes the architecture of the testability hardware and its test sessions. Describing many of the on-chip decompression algorithms in Verilog helps to evaluate these algorithms in terms of hardware overhead and timing, and thus feasibility of using them for System-on-Chip designs. Extensive use of testbenches and testbench development techniques is another unique feature of this book. Using PLI in developing testbenches and virtual testers provides a powerful programming tool, interfaced with hardware described in Verilog. This mixed hardware/software environment facilitates description of complex test programs and test strategies. |
| testable combinational logic circuit design: Design of Testable Logic Circuits R. G. Bennetts, 1984 |
| testable combinational logic circuit design: Logic Testing and Design for Testability Hideo Fujiwara, 1985 Design for testability techniques offer one approach toward alleviating this situation by adding enough extra circuitry to a circuit or chip to reduce the complexity of testing. |
| testable combinational logic circuit design: Testing and Reliable Design of CMOS Circuits Niraj K. Jha, Sandip Kundu, 2012-12-06 In the last few years CMOS technology has become increas ingly dominant for realizing Very Large Scale Integrated (VLSI) circuits. The popularity of this technology is due to its high den sity and low power requirement. The ability to realize very com plex circuits on a single chip has brought about a revolution in the world of electronics and computers. However, the rapid advance ments in this area pose many new problems in the area of testing. Testing has become a very time-consuming process. In order to ease the burden of testing, many schemes for designing the circuit for improved testability have been presented. These design for testability techniques have begun to catch the attention of chip manufacturers. The trend is towards placing increased emphasis on these techniques. Another byproduct of the increase in the complexity of chips is their higher susceptibility to faults. In order to take care of this problem, we need to build fault-tolerant systems. The area of fault-tolerant computing has steadily gained in importance. Today many universities offer courses in the areas of digital system testing and fault-tolerant computing. Due to the impor tance of CMOS technology, a significant portion of these courses may be devoted to CMOS testing. This book has been written as a reference text for such courses offered at the senior or graduate level. Familiarity with logic design and switching theory is assumed. The book should also prove to be useful to professionals working in the semiconductor industry. |
| testable combinational logic circuit design: An Introduction to Logic Circuit Testing Parag K. Lala, 2022-06-01 An Introduction to Logic Circuit Testing provides a detailed coverage of techniques for test generation and testable design of digital electronic circuits/systems. The material covered in the book should be sufficient for a course, or part of a course, in digital circuit testing for senior-level undergraduate and first-year graduate students in Electrical Engineering and Computer Science. The book will also be a valuable resource for engineers working in the industry. This book has four chapters. Chapter 1 deals with various types of faults that may occur in very large scale integration (VLSI)-based digital circuits. Chapter 2 introduces the major concepts of all test generation techniques such as redundancy, fault coverage, sensitization, and backtracking. Chapter 3 introduces the key concepts of testability, followed by some ad hoc design-for-testability rules that can be used to enhance testability of combinational circuits. Chapter 4 deals with test generation and response evaluation techniques used in BIST (built-in self-test) schemes for VLSI chips. Table of Contents: Introduction / Fault Detection in Logic Circuits / Design for Testability / Built-in Self-Test / References |
| testable combinational logic circuit design: Design of Logic Systems DAVID PROTHEROE DOUGLAS LEWIN, 2013-11-21 |
| testable combinational logic circuit design: Introduction to VLSI Systems Ming-Bo Lin, 2011-11-28 With the advance of semiconductors and ubiquitous computing, the use of system-on-a-chip (SoC) has become an essential technique to reduce product cost. With this progress and continuous reduction of feature sizes, and the development of very large-scale integration (VLSI) circuits, addressing the harder problems requires fundamental understanding of circuit and layout design issues. Furthermore, engineers can often develop their physical intuition to estimate the behavior of circuits rapidly without relying predominantly on computer-aided design (CAD) tools. Introduction to VLSI Systems: A Logic, Circuit, and System Perspective addresses the need for teaching such a topic in terms of a logic, circuit, and system design perspective. To achieve the above-mentioned goals, this classroom-tested book focuses on: Implementing a digital system as a full-custom integrated circuit Switch logic design and useful paradigms that may apply to various static and dynamic logic families The fabrication and layout designs of complementary metal-oxide-semiconductor (CMOS) VLSI Important issues of modern CMOS processes, including deep submicron devices, circuit optimization, interconnect modeling and optimization, signal integrity, power integrity, clocking and timing, power dissipation, and electrostatic discharge (ESD) Introduction to VLSI Systems builds an understanding of integrated circuits from the bottom up, paying much attention to logic circuit, layout, and system designs. Armed with these tools, readers can not only comprehensively understand the features and limitations of modern VLSI technologies, but also have enough background to adapt to this ever-changing field. |
| testable combinational logic circuit design: Encyclopedia of Computer Science and Technology Allen Kent, James G. Williams, 1997-02-14 Artificial Intelligence in Economics and Managemetn to Requirements Engineering |
| testable combinational logic circuit design: Additive Cellular Automata Parimal Pal Chaudhuri, Dipanwita Roy Chowdhury, Sukumar Nandi, Santanu Chattopadhyay, 1997-07-11 This book presents an extensive survey and report of related research on important developments in cellular automata (CA) theory. The authors introduce you to this theory in a comprehensive manner that will help you understand the basics of CA and be prepared for further research. They illustrate the matrix algebraic tools that characterize group CA and help develop its applications in the field of VLSI testing. The text examines schemes based on easily testable FSM, bit-error correcting code, byte error correcting code, and characterization of 2D cellular automata. In addition, it looks into CA-based universal pattern generation, data encryption, and synthesis of easily testable combinational logic. The book covers new characterizations of group CA behavior, CA-based tools for fault diagnosis, and a wide variety of applications to solve real-life problems. |
| testable combinational logic circuit design: Decision Diagram Techniques for Micro- and Nanoelectronic Design Handbook Svetlana N. Yanushkevich, D. Michael Miller, Vlad P. Shmerko, Radomir S. Stankovic, 2018-10-03 Decision diagram (DD) techniques are very popular in the electronic design automation (EDA) of integrated circuits, and for good reason. They can accurately simulate logic design, can show where to make reductions in complexity, and can be easily modified to model different scenarios. Presenting DD techniques from an applied perspective, Decision Diagram Techniques for Micro- and Nanoelectronic Design Handbook provides a comprehensive, up-to-date collection of DD techniques. Experts with more than forty years of combined experience in both industrial and academic settings demonstrate how to apply the techniques to full advantage with more than 400 examples and illustrations. Beginning with the fundamental theory, data structures, and logic underlying DD techniques, they explore a breadth of topics from arithmetic and word-level representations to spectral techniques and event-driven analysis. The book also includes abundant references to more detailed information and additional applications. Decision Diagram Techniques for Micro- and Nanoelectronic Design Handbook collects the theory, methods, and practical knowledge necessary to design more advanced circuits and places it at your fingertips in a single, concise reference. |
| testable combinational logic circuit design: Simulation in the Design of Digital Electronic Systems John B. Gosling, 1993-10-29 This description of the structure of simulators suitable for use in the design of digital electronic systems includes the compiled code and event driven algorithms for digital electronic system simulators, together with timing verification as well as structural limitations and problems. |
| testable combinational logic circuit design: Random Testing of Digital Circuits David, 2020-11-25 Introduces a theory of random testing in digital circuits for the first time and offers practical guidance for the implementation of random pattern generators, signature analyzers design for random testability, and testing results. Contains several new and unpublished results. |
| testable combinational logic circuit design: Towards One-Pass Synthesis Rolf Drechsler, Wolfgang Günther, 2013-03-14 The design process of digital circuits is often carried out in individual steps, like logic synthesis, mapping, and routing. Since originally the complete process was too complex, it has been split up in several - more or less independen- phases. In the last 40 years powerful algorithms have been developed to find optimal solutions for each of these steps. However, the interaction of these different algorithms has not been considered for a long time. This leads to quality loss e. g. in cases where highly optimized netlists fit badly onto the target architecture. Since the resulting circuits are often far from being optimal and insufficient regarding the optimization criteria, like area and delay, several iterations of the complete design process have to be carried out to get high quality results. This is a very time consuming and costly process. For this reason, some years ago the idea of one-pass synthesis came up. There were two main approaches how to guarantee that a design got first time right : 1. Combining levels that were split before, e. g. to use layout information already during the logic synthesis phase. 2. Restricting the optimization in one level such that it better fits to the next one. So far, several approaches in these two directions have been presented and new techniques are under development. In this book we describe the new paradigm that is used in one-pass synthesis and present examples for the two techniques above. |
| testable combinational logic circuit design: Field-Coupled Nanocomputing Neal G. Anderson, Sanjukta Bhanja, 2014-05-31 Field-coupled nanocomputing (FCN) paradigms offer fundamentally new approaches to digital information processing that do not utilize transistors or require charge transport. Information transfer and computation are achieved in FCN via local field interactions between nanoscale building blocks that are organized in patterned arrays. Several FCN paradigms are currently under active investigation, including quantum-dot cellular automata (QCA), molecular quantum cellular automata (MQCA), nanomagnetic logic (NML), and atomic quantum cellular automata (AQCA). Each of these paradigms has a number of unique features that make it attractive as a candidate for post-CMOS nanocomputing, and each faces critical challenges to realization. This State-of-the-Art-Survey provides a snapshot of the current developments and novel research directions in the area of FCN. The book is divided into five sections. The first part, Field-Coupled Nanocomputing Paradigms, provides valuable background information and perspectives on the QDCA, MQCA, NML, and AQCA paradigms and their evolution. The second section, Circuits and Architectures, addresses a wide variety of current research on FCN clocking strategies, logic synthesis, circuit design and test, logic-in-memory, hardware security, and architecture. The third section, Modeling and Simulation, considers the theoretical modeling and computer simulation of large FCN circuits, as well as the use of simulations for gleaning physical insight into elementary FCN building blocks. The fourth section, Irreversibility and Dissipation, considers the dissipative consequences of irreversible information loss in FCN circuits, their quantification, and their connection to circuit structure. The fifth section, The Road Ahead: Opportunities and Challenges, includes an edited transcript of the panel discussion that concluded the FCN 13 workshop. |
| testable combinational logic circuit design: VLSI Test Principles and Architectures Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen, 2006-08-14 This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. - Most up-to-date coverage of design for testability. - Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. - Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. |
| testable combinational logic circuit design: Advances in Computers , 1987-06-01 Advances in Computers |
| testable combinational logic circuit design: VLSI Design and Test S. Rajaram, N.B. Balamurugan, D. Gracia Nirmala Rani, Virendra Singh, 2019-01-24 This book constitutes the refereed proceedings of the 22st International Symposium on VLSI Design and Test, VDAT 2018, held in Madurai, India, in June 2018. The 39 full papers and 11 short papers presented together with 8 poster papers were carefully reviewed and selected from 231 submissions. The papers are organized in topical sections named: digital design; analog and mixed signal design; hardware security; micro bio-fluidics; VLSI testing; analog circuits and devices; network-on-chip; memory; quantum computing and NoC; sensors and interfaces. |
| testable combinational logic circuit design: A Designer's Guide to VHDL Synthesis Douglas E. Ott, Thomas J. Wilderotter, 2013-12-19 A Designer's Guide to VHDL Synthesis is intended for both design engineers who want to use VHDL-based logic synthesis ASICs and for managers who need to gain a practical understanding of the issues involved in using this technology. The emphasis is placed more on practical applications of VHDL and synthesis based on actual experiences, rather than on a more theoretical approach to the language. VHDL and logic synthesis tools provide very powerful capabilities for ASIC design, but are also very complex and represent a radical departure from traditional design methods. This situation has made it difficult to get started in using this technology for both designers and management, since a major learning effort and `culture' change is required. A Designer's Guide to VHDL Synthesis has been written to help design engineers and other professionals successfully make the transition to a design methodology based on VHDL and log synthesis instead of the more traditional schematic based approach. While there are a number of texts on the VHDL language and its use in simulation, little has been written from a designer's viewpoint on how to use VHDL and logic synthesis to design real ASIC systems. The material in this book is based on experience gained in successfully using these techniques for ASIC design and relies heavily on realistic examples to demonstrate the principles involved. |
| testable combinational logic circuit design: Design and Testing of Reversible Logic Ashutosh Kumar Singh, Masahiro Fujita, Anand Mohan, 2019-07-29 The book compiles efficient design and test methodologies for the implementation of reversible logic circuits. The methodologies covered in the book are design approaches, test approaches, fault tolerance in reversible circuits and physical implementation techniques. The book also covers the challenges and the reversible logic circuits to meet these challenges stimulated during each stage of work cycle. The novel computing paradigms are being explored to serve as a basis for fast and low power computation. |
| testable combinational logic circuit design: Delay Fault Testing for VLSI Circuits Angela Krstic, Kwang-Ting (Tim) Cheng, 2012-12-06 In the early days of digital design, we were concerned with the logical correctness of circuits. We knew that if we slowed down the clock signal sufficiently, the circuit would function correctly. With improvements in the semiconductor process technology, our expectations on speed have soared. A frequently asked question in the last decade has been how fast can the clock run. This puts significant demands on timing analysis and delay testing. Fueled by the above events, a tremendous growth has occurred in the research on delay testing. Recent work includes fault models, algorithms for test generation and fault simulation, and methods for design and synthesis for testability. The authors of this book, Angela Krstic and Tim Cheng, have personally contributed to this research. Now they do an even greater service to the profession by collecting the work of a large number of researchers. In addition to expounding such a great deal of information, they have delivered it with utmost clarity. To further the reader's understanding many key concepts are illustrated by simple examples. The basic ideas of delay testing have reached a level of maturity that makes them suitable for practice. In that sense, this book is the best x DELAY FAULT TESTING FOR VLSI CIRCUITS available guide for an engineer designing or testing VLSI systems. Tech niques for path delay testing and for use of slower test equipment to test high-speed circuits are of particular interest. |
| testable combinational logic circuit design: Computers, Software Engineering, and Digital Devices Richard C. Dorf, 2018-10-03 In two editions spanning more than a decade, The Electrical Engineering Handbook stands as the definitive reference to the multidisciplinary field of electrical engineering. Our knowledge continues to grow, and so does the Handbook. For the third edition, it has expanded into a set of six books carefully focused on a specialized area or field of study. Each book represents a concise yet definitive collection of key concepts, models, and equations in its respective domain, thoughtfully gathered for convenient access. Computers, Software Engineering, and Digital Devices examines digital and logical devices, displays, testing, software, and computers, presenting the fundamental concepts needed to ensure a thorough understanding of each field. It treats the emerging fields of programmable logic, hardware description languages, and parallel computing in detail. Each article includes defining terms, references, and sources of further information. Encompassing the work of the world's foremost experts in their respective specialties, Computers, Software Engineering, and Digital Devices features the latest developments, the broadest scope of coverage, and new material on secure electronic commerce and parallel computing. |
| testable combinational logic circuit design: Electro ... Conference Record , 1990 |
| testable combinational logic circuit design: The Best of ICCAD Andreas Kuehlmann, 2012-12-06 In 2002, the International Conference on Computer Aided Design (ICCAD) celebrates its 20th anniversary. This book commemorates contributions made by ICCAD to the broad field of design automation during that time. The foundation of ICCAD in 1982 coincided with the growth of Large Scale Integration. The sharply increased functionality of board-level circuits led to a major demand for more powerful Electronic Design Automation (EDA) tools. At the same time, LSI grew quickly and advanced circuit integration became widely avail able. This, in turn, required new tools, using sophisticated modeling, analysis and optimization algorithms in order to manage the evermore complex design processes. Not surprisingly, during the same period, a number of start-up com panies began to commercialize EDA solutions, complementing various existing in-house efforts. The overall increased interest in Design Automation (DA) re quired a new forum for the emerging community of EDA professionals; one which would be focused on the publication of high-quality research results and provide a structure for the exchange of ideas on a broad scale. Many of the original ICCAD volunteers were also members of CANDE (Computer-Aided Network Design), a workshop of the IEEE Circuits and Sys tem Society. In fact, it was at a CANDE workshop that Bill McCalla suggested the creation of a conference for the EDA professional. (Bill later developed the name). |
| testable combinational logic circuit design: A Practical Approach to VLSI System on Chip (SoC) Design Veena S. Chakravarthi, 2022-12-13 Now in a thoroughly revised second edition, this practical practitioner guide provides a comprehensive overview of the SoC design process. It explains end-to-end system on chip (SoC) design processes and includes updated coverage of design methodology, the design environment, EDA tool flow, design decisions, choice of design intellectual property (IP) cores, sign-off procedures, and design infrastructure requirements. The second edition provides new information on SOC trends and updated design cases. Coverage also includes critical advanced guidance on the latest UPF-based low power design flow, challenges of deep submicron technologies, and 3D design fundamentals, which will prepare the readers for the challenges of working at the nanotechnology scale. A Practical Approach to VLSI System on Chip (SoC) Design: A Comprehensive Guide, Second Edition provides engineers who aspire to become VLSI designers with all the necessary information and details of EDA tools. It will be a valuable professional reference for those working on VLSI design and verification portfolios in complex SoC designs |
| testable combinational logic circuit design: Handbook of VLSI Chip Design and Expert Systems A. F. Schwarz, 2014-05-10 Handbook of VLSI Chip Design and Expert Systems provides information pertinent to the fundamental aspects of expert systems, which provides a knowledge-based approach to problem solving. This book discusses the use of expert systems in every possible subtask of VLSI chip design as well as in the interrelations between the subtasks. Organized into nine chapters, this book begins with an overview of design automation, which can be identified as Computer-Aided Design of Circuits and Systems (CADCAS). This text then presents the progress in artificial intelligence, with emphasis on expert systems. Other chapters consider the impact of design automation, which exploits the basic capabilities of computers to perform complex calculations and to handle huge amounts of data with a high speed and accuracy. This book discusses as well the characterization of microprocessors. The final chapter deals with interactive I/O devices. This book is a valuable resource for system design experts, circuit analysts and designers, logic designers, device engineers, technologists, and application-specific designers. |
| testable combinational logic circuit design: Logic Design Principles Edward J. McCluskey, 1986 |
| testable combinational logic circuit design: On-Line Testing for VLSI Michael Nicolaidis, Yervant Zorian, Dhiraj Pradhan, 2013-03-09 Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs. On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties. On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers. |
| testable combinational logic circuit design: Proceedings of the ... European Test Conference , 1991 |
| testable combinational logic circuit design: Research in Progress , 1982 |
| testable combinational logic circuit design: Self-Checking and Fault-Tolerant Digital Design Parag K. Lala, 2001 With VLSI chip transistors getting smaller and smaller, today's digital systems are more complex than ever before. This increased complexity leads to more cross-talk, noise, and other sources of transient errors during normal operation. Traditional off-line testing strategies cannot guarantee detection of these transient faults. And with critical applications relying on faster, more powerful chips, fault-tolerant, self-checking mechanisms must be built in to assure reliable operation. Self-Checking and Fault-Tolerant Digital Design deals extensively with self-checking design techniques and is the only book that emphasizes major techniques for hardware fault tolerance. Graduate students in VLSI design courses as well as practicing designers will appreciate this balanced treatment of the concepts and theory underlying fault tolerance along with the practical techniques used to create fault-tolerant systems. Features: Introduces reliability theory and the importance of maintainability Presents coding and the construction of several error detecting and correcting codes Discusses in depth, the available techniques for fail-safe design of combinational circuits Details checker design techniques for detecting erroneous bits and encoding output of self-checking circuits Demonstrates how to design self-checking sequential circuits, including a technique for fail-safe state machine design |
| testable combinational logic circuit design: COMPEURO'90 , 1990 |
| testable combinational logic circuit design: Logic Synthesis and Verification Algorithms Gary D. Hachtel, Fabio Somenzi, 2005-12-17 Logic Synthesis and Verification Algorithms is a textbook designed for courses on VLSI Logic Synthesis and Verification, Design Automation, CAD and advanced level discrete mathematics. It also serves as a basic reference work in design automation for both professionals and students. Logic Synthesis and Verification Algorithms is about the theoretical underpinnings of VLSI (Very Large Scale Integrated Circuits). It combines and integrates modern developments in logic synthesis and formal verification with the more traditional matter of Switching and Finite Automata Theory. The book also provides background material on Boolean algebra and discrete mathematics. A unique feature of this text is the large collection of solved problems. Throughout the text the algorithms covered are the subject of one or more problems based on the use of available synthesis programs. |
| testable combinational logic circuit design: Lecture Notes in Analog Electronics Vančo B. Litovski, 2025-01-17 Prof. Vančo Litovski was born in 1947 in Rakita, South Macedonia, Greece. He graduated from the Faculty of Electronic Engineering in Niš in 1970 and obtained his M.Sc. in 1974 and his Ph.D. in 1977. He was appointed as a teaching assistant at the Faculty of Electronic Engineering in 1970 and became a full professor at the same faculty in 1987. He was elected as a visiting professor (honoris causa) at the University of Southampton in 1999. From 1987 until 1990, he was a consultant to the CEO of Ei and was the head of the Chair of Electronics at the Faculty of Electronic Engineering in Niš for 12 years. From 2015 to 2017, he was a researcher at the University of Bath.. He received several awards including from the Faculty of Electronic Engineering (Charter in 1980, Charter in 1985, and a Special Recognition in 1995) and the University of Niš (Plaque 1985). |
| testable combinational logic circuit design: Fault Diagnosis of Digital Circuits V. N. Yarmolik, 1990 The continual explosion of computer development has led to inadequate coverage of proper & useful on-line testing techniques. This text fills the gap in the literature by presenting the latest techniques available for digital devices used in the most popular computers. Initial chapters explore the classic problems of on-line testing, pointing out the limited applications of conventional approaches to the problem of diagnosing digital devices using LSI & VLSI chips. Chapters 4-7 cover compact testing methods used to diagnose complex digital circuits. Chapters 8 & 9 analyze the techniques of compressing output responses of a digital circuit, while chapter 10 surveys promising recent signature generation techniques for binary sequences. The final chapter covers multi-output digital circuits. |
| testable combinational logic circuit design: A Unified Approach for Timing Verification and Delay Fault Testing Mukund Sivaraman, Andrzej J. Strojwas, 2012-09-17 Large system complexities and operation under tight timing constraints in rapidly shrinking technologies have made it extremely important to ensure correct temporal behavior of modern-day digital circuits, both before and after fabrication. Research in (pre-fabrication) timing verification and (post-fabrication) delay fault testing has evolved along largely disjoint lines in spite of the fact that they share many basic concepts. A Unified Approach for Timing Verification and Delay Fault Testing applies concepts developed in the context of delay fault testing to path sensitization, which allows an accurate timing analysis mechanism to be developed. This path sensitization strategy is further applied for efficient delay fault diagnosis and delay fault coverage estimation. A new path sensitization strategy called Signal Stabilization Time Analysis (SSTA) has been developed based on the fact that primitive PDFs determine the stabilization time of the circuit outputs. This analysis has been used to develop a feasible method of identifying the primitive PDFs in a general multi-level logic circuit. An approach to determine the maximum circuit delay using this primitive PDF identification mechanism is also presented. The Primitive PDF Identification-based Timing Analysis (PITA) approach is proved to determine the maximum floating mode circuit delay exactly under any component delay model, and provides several advantages over previously floating mode timing analyzers. A framework for the diagnosis of circuit failures caused by distributed path delay faults is also presented. A metric to quantify the diagnosability of a path delay fault for a test is also proposed. Finally, the book presents a very realistic metric for delay fault coverage which accounts for delay fault size distributions and is applicable to any delay fault model. A Unified Approach for Timing Verification and Delay Fault Testing will be of interest to university and industry researchers in timing analysis and delay fault testing as well as EDA tool development engineers and design verification engineers dealing with timing issues in ULSI circuits. The book should also be of interest to digital designers and others interested in knowing the state of the art in timing verification and delay fault testing. |
| testable combinational logic circuit design: 30th Midwest Symposium on Circuits and Systems Kamal Jabbour, 1988 |
| testable combinational logic circuit design: RLE Progress Report Massachusetts Institute of Technology. Research Laboratory of Electronics, 1991 |
| testable combinational logic circuit design: Proceedings , 1988 |
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Define testable. testable synonyms, testable pronunciation, testable translation, English dictionary definition of testable. n. 1. A procedure for critical evaluation; a means of determining the …
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Create experiments and surveys in minutes. Recruit best-in-class participants for your studies. Transform your Psychology classroom into an interactive lab. All on Testable.
TESTABLE Definition & Meaning - Merriam-Webster
: something (such as a series of questions or exercises) for measuring the skill, knowledge, intelligence, capacities, or aptitudes of an individual or group. : a procedure, reaction, or …
TESTABLE | definition in the Cambridge English Dictionary
Any experiment in science needs a testable hypothesis. Some testable theories, when found to be false, are still upheld by their admirers. No testable evidence was provided. The challenge was …
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testable adjective - Definition, pictures, pronunciation and ...
Definition of testable adjective in Oxford Advanced Learner's Dictionary. Meaning, pronunciation, picture, example sentences, grammar, usage notes, synonyms and more.
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Getting Started, Experiment Options, Feature Manual, FAQs, Testable Minds, Video Tutorials, Contact us
Testable - definition of testable by The Free Dictionary
Define testable. testable synonyms, testable pronunciation, testable translation, English dictionary definition of testable. n. 1. A procedure for critical evaluation; a means of determining the …
